Estimate of tungsten thin films thermal conductivity from electrical measurements using Wiedemann-Franz Law

  • Armando Jesús Cetina Quiñones Universidad Autónoma De Yucatán
  • Carlos Castro Montalvo Universidad Autónoma de Yucatán
  • Oyuki Chi Prudencio Universidad Autónoma de Yucatán
  • Milenis Acosta Díaz Universidad Autónoma de Yucatán
Keywords: Tungsten thin films; RF magnetron sputtering; electrical conductivity; thermal conductivity; Wiedemann-Franz law, Tungsten thin films, RF magnetron sputtering, electrical conductivity, thermal conductivity, Wiedemann-Franz law

Abstract

Tungsten thin films were grown on glass substrates by RF sputtering using argon pressures from 5 to 35 mTorr. The electrical properties for all samples were measured using a Hall system, the values obtained for carrier concentration are around 1022 holes/cm3. Changes in the electrical conductivity were correlated with the transport mechanism of the sputtered W in the background Ar gas. With the measured electrical conductivity was possible to calculate the thermal conductivity using the Wiedemann-Franz law. The calculated thermal conductivities were in a good agreement with previous experimental reports in the literature, suggesting that W thin films grown in low argon pressures have potential applications as metallic thin films in multilayers absorber of solar collectors.

Author Biography

Armando Jesús Cetina Quiñones, Universidad Autónoma De Yucatán
Estudiante de licenciatura de la facultad de ingeniería de la UADY

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Published
2019-09-10
Section
Artículos de Investigación